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Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition

Tuba Kiyan, Christof Brillert, Christian Boit. Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. Microelectronics Reliability, 48(8-9):1327-1332, 2008. [doi]

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