With great reliability comes great responsibility: tradeoffs of run-time policy on high reliability systems

Stephen D. Kleban, J. R. Johnston, J. A. Ang, Scott H. Clearwater. With great reliability comes great responsibility: tradeoffs of run-time policy on high reliability systems. In 4th IEEE/ACM International Symposium on Cluster Computing and the Grid (CCGrid 2004), April 19-22, 2004, Chicago, Illinois, USA. pages 547-554, IEEE Computer Society, 2004. [doi]

Abstract

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