Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn. A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience. IEEE Micro, 33(4):46-55, 2013. [doi]
Abstract is missing.