Richard P. Kleihorst, Nico F. Benschop. Fault Tolerant ICs by Area-Optimized Error Correcting Codes. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 143, IEEE Computer Society, 2001. [doi]
@inproceedings{KleihorstB01,
title = {Fault Tolerant ICs by Area-Optimized Error Correcting Codes},
author = {Richard P. Kleihorst and Nico F. Benschop},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2001/1290/00/12900143.pdf},
tags = {optimization},
researchr = {https://researchr.org/publication/KleihorstB01},
cites = {0},
citedby = {0},
pages = {143},
booktitle = {7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy},
publisher = {IEEE Computer Society},
isbn = {0-7695-1290-9},
}