Automatic feature selection for anomaly detection

Marius Kloft, Ulf Brefeld, Patrick Düssel, Christian Gehl, Pavel Laskov. Automatic feature selection for anomaly detection. In Dirk Balfanz, Jessica Staddon, editors, Proceedings of the 1st ACM Workshop on AISec, AISec 2008, Alexandria, VA, USA, October 27, 2008. pages 71-76, ACM, 2008. [doi]

Abstract

Abstract is missing.