Wlodzimierz Klonowski, Elzbieta Olejarczyk, Robert Stepien. SEM Image Analysis for Roughness Assessment of Implant Materials. In Marek Kurzynski, Edward Puchala, Michal Wozniak, Andrzej Zolnierek, editors, Computer Recognition Systems, Proceedings of the 4th International Conference on Computer Recognition Systems, CORES 05, May 22-25, 2005, Rydzyna Castle, Poland. Volume 30 of Advances in Soft Computing, pages 553-560, Springer, 2005. [doi]
Abstract is missing.