Miron Klosowski, Jacek Jakusz, Waldemar Jendernalik, Grzegorz Blakiewicz, Stanislaw Szczepanski, Slawomir Koziel. A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors. IEEE T. Instrumentation and Measurement, 67(10):2363-2372, 2018. [doi]
Abstract is missing.