Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Christian Kovács. Degradation behavior in upstream/downstream via test structures. Microelectronics Reliability, 54(9-10):1724-1728, 2014. [doi]
@article{KludtWAHK14,
title = {Degradation behavior in upstream/downstream via test structures},
author = {Jörg Kludt and Kirsten Weide-Zaage and Markus Ackermann and Verena Hein and Christian Kovács},
year = {2014},
doi = {10.1016/j.microrel.2014.07.042},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.042},
researchr = {https://researchr.org/publication/KludtWAHK14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {1724-1728},
}