Tihomir Knezevic, Lis K. Nanver, Tomislav Suligoj. Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions. In Petar Biljanovic, Marko Koricic, Karolj Skala, Tihana Galinac Grbac, Marina Cicin-Sain, Vlado Sruk, Slobodan Ribaric, Stjepan Gros, Boris Vrdoljak, Mladen Mauher, Edvard Tijan, Filip Hormot, editors, 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017, Opatija, Croatia, May 22-26, 2017. pages 72-76, IEEE, 2017. [doi]
@inproceedings{KnezevicNS17,
title = {Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions},
author = {Tihomir Knezevic and Lis K. Nanver and Tomislav Suligoj},
year = {2017},
doi = {10.23919/MIPRO.2017.7973393},
url = {https://doi.org/10.23919/MIPRO.2017.7973393},
researchr = {https://researchr.org/publication/KnezevicNS17},
cites = {0},
citedby = {0},
pages = {72-76},
booktitle = {40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017, Opatija, Croatia, May 22-26, 2017},
editor = {Petar Biljanovic and Marko Koricic and Karolj Skala and Tihana Galinac Grbac and Marina Cicin-Sain and Vlado Sruk and Slobodan Ribaric and Stjepan Gros and Boris Vrdoljak and Mladen Mauher and Edvard Tijan and Filip Hormot},
publisher = {IEEE},
isbn = {978-953-233-090-8},
}