Finding Suitable Gate Insulators for Reliable 2D FETs

Theresia Knobloch, Yury Yu. Illarionov, Tibor Grasser. Finding Suitable Gate Insulators for Reliable 2D FETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 2, IEEE, 2022. [doi]

Authors

Theresia Knobloch

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Yury Yu. Illarionov

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Tibor Grasser

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