BEC: Bit-Level Static Analysis for Reliability against Soft Errors

Yousun Ko 0001, Bernd Burgstaller. BEC: Bit-Level Static Analysis for Reliability against Soft Errors. In Tobias Grosser, Christophe Dubach, Michel Steuwer, Jingling Xue, Guilherme Ottoni, ernando Magno Quintão Pereira, editors, IEEE/ACM International Symposium on Code Generation and Optimization, CGO 2024, Edinburgh, United Kingdom, March 2-6, 2024. pages 283-295, IEEE, 2024. [doi]

Abstract

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