Analyzing technology impact networks for R&D planning using patents: combined application of network approaches

Sung-Seok Ko, Namuk Ko, Doyeon Kim, Hyunseok Park, Janghyeok Yoon. Analyzing technology impact networks for R&D planning using patents: combined application of network approaches. Scientometrics, 101(1):917-936, 2014. [doi]

Authors

Sung-Seok Ko

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Namuk Ko

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Doyeon Kim

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Hyunseok Park

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Janghyeok Yoon

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