Analyzing technology impact networks for R&D planning using patents: combined application of network approaches

Sung-Seok Ko, Namuk Ko, Doyeon Kim, Hyunseok Park, Janghyeok Yoon. Analyzing technology impact networks for R&D planning using patents: combined application of network approaches. Scientometrics, 101(1):917-936, 2014. [doi]

Abstract

Abstract is missing.