X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns

ByoungChul Ko, Seong-Hoon Kim, Jae Yeal Nam. X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns. J. Digital Imaging, 24(6):1141-1151, 2011. [doi]

Authors

ByoungChul Ko

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Seong-Hoon Kim

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Jae Yeal Nam

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