ByoungChul Ko, Seong-Hoon Kim, Jae Yeal Nam. X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns. J. Digital Imaging, 24(6):1141-1151, 2011. [doi]
@article{KoKN11-0,
title = {X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns},
author = {ByoungChul Ko and Seong-Hoon Kim and Jae Yeal Nam},
year = {2011},
doi = {10.1007/s10278-011-9380-3},
url = {http://dx.doi.org/10.1007/s10278-011-9380-3},
researchr = {https://researchr.org/publication/KoKN11-0},
cites = {0},
citedby = {0},
journal = {J. Digital Imaging},
volume = {24},
number = {6},
pages = {1141-1151},
}