Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation

Ho Fai Ko, Nicola Nicolici. Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 1298-1303, 2008. [doi]

@inproceedings{KoN08:1,
  title = {Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation},
  author = {Ho Fai Ko and Nicola Nicolici},
  year = {2008},
  doi = {10.1109/DATE.2008.4484858},
  url = {http://dx.doi.org/10.1109/DATE.2008.4484858},
  researchr = {https://researchr.org/publication/KoN08%3A1},
  cites = {0},
  citedby = {0},
  pages = {1298-1303},
  booktitle = {Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008},
}