Ho Fai Ko, Nicola Nicolici. Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy. J. Electronic Testing, 24(4):393-403, 2008. [doi]
@article{KoN08:2,
title = {Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy},
author = {Ho Fai Ko and Nicola Nicolici},
year = {2008},
doi = {10.1007/s10836-007-5036-0},
url = {http://dx.doi.org/10.1007/s10836-007-5036-0},
tags = {testing},
researchr = {https://researchr.org/publication/KoN08%3A2},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {4},
pages = {393-403},
}