Testing System-On-Chip by Summations of Cores? Test Output Voltages

K. Y. Ko, Mike W. T. Wong, Y. S. Lee. Testing System-On-Chip by Summations of Cores? Test Output Voltages. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 350-355, IEEE Computer Society, 2002. [doi]

Authors

K. Y. Ko

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Mike W. T. Wong

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Y. S. Lee

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