K. Y. Ko, Mike W. T. Wong, Y. S. Lee. Testing System-On-Chip by Summations of Cores? Test Output Voltages. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 350-355, IEEE Computer Society, 2002. [doi]
@inproceedings{KoWL02,
title = {Testing System-On-Chip by Summations of Cores? Test Output Voltages},
author = {K. Y. Ko and Mike W. T. Wong and Y. S. Lee},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250350abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KoWL02},
cites = {0},
citedby = {0},
pages = {350-355},
booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1825-7},
}