A 90 nm 48 x 48 LUT-Based FPGA Enhancing Speed and Yield Utilizing Within-Die Delay Variations - researchr publication authors

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Kazutoshi Kobayashi, Kazuya Katsuki, Manabu Kotani, Yuuri Sugihara, Yohei Kume, Hidetoshi Onodera. A 90 nm 48 x 48 LUT-Based FPGA Enhancing Speed and Yield Utilizing Within-Die Delay Variations. IEICE Transactions, 90-C(10):1919-1926, 2007. [doi]

This author has not been identified. Look up 'Kazutoshi Kobayashi' in GoogleThis author has not been identified. Look up 'Kazuya Katsuki' in GoogleThis author has not been identified. Look up 'Manabu Kotani' in GoogleThis author has not been identified. Look up 'Yuuri Sugihara' in GoogleThis author has not been identified. Look up 'Yohei Kume' in GoogleThis author has not been identified. Look up 'Hidetoshi Onodera' in Google

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