Do Different Deep Metric Learning Losses Lead to Similar Learned Features? - researchr publication authors

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Konstantin Kobs, Michael Steininger, Andrzej Dulny, Andreas Hotho. Do Different Deep Metric Learning Losses Lead to Similar Learned Features?. In 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021. pages 10624-10634, IEEE, 2021. [doi]

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