Konstantin Kobs, Michael Steininger, Andrzej Dulny, Andreas Hotho. Do Different Deep Metric Learning Losses Lead to Similar Learned Features?. In 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021. pages 10624-10634, IEEE, 2021. [doi]
@inproceedings{KobsSDH21, title = {Do Different Deep Metric Learning Losses Lead to Similar Learned Features?}, author = {Konstantin Kobs and Michael Steininger and Andrzej Dulny and Andreas Hotho}, year = {2021}, doi = {10.1109/ICCV48922.2021.01047}, url = {https://doi.org/10.1109/ICCV48922.2021.01047}, researchr = {https://researchr.org/publication/KobsSDH21}, cites = {0}, citedby = {0}, pages = {10624-10634}, booktitle = {2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021}, publisher = {IEEE}, isbn = {978-1-6654-2812-5}, }