Stephen Kockentiedt, Klaus D. Toennies, Erhardt Gierke, Nico Dziurowitz, Carmen Thim, Sabine Plitzko. Automatic Detection and Recognition of Engineered Nanoparticles in SEM Images. In Michael Goesele, Thorsten Grosch, Holger Theisel, Klaus D. Toennies, Bernhard Preim, editors, Proceedings of the Vision, Modeling, and Visualization Workshop 2012, Magdeburg, Germany, 2012. pages 23-30, Eurographics Association, 2012. [doi]
Abstract is missing.