Yasumasa Koda, Rihito Kuroda, Taiki Nakazawa, Y. Nakao, Shigetoshi Sugawa. A UV Si-photodiode with almost 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack. In Ralf Widenhorn, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013. Volume 8659 of SPIE Proceedings, SPIE, 2013. [doi]
@inproceedings{KodaKNNS13,
title = {A UV Si-photodiode with almost 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack},
author = {Yasumasa Koda and Rihito Kuroda and Taiki Nakazawa and Y. Nakao and Shigetoshi Sugawa},
year = {2013},
doi = {10.1117/12.2005574},
url = {https://doi.org/10.1117/12.2005574},
researchr = {https://researchr.org/publication/KodaKNNS13},
cites = {0},
citedby = {0},
booktitle = {Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013},
editor = {Ralf Widenhorn and Antoine Dupret},
volume = {8659},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819494320},
}