Eunyee Koh, Daniel Caruso, Andruid Kerne, Ricardo Gutierrez-Osuna. Elimination of junk document surrogate candidates through pattern recognition. In Peter R. King, Steven J. Simske, editors, Proceedings of the 2007 ACM Symposium on Document Engineering, Winnipeg, Manitoba, Canada, August 28-31, 2007. pages 187-195, ACM, 2007. [doi]
Abstract is missing.