A CMOS image sensor with 2.0-e:::-::: random noise and 110-ke:::-::: full well capacity using column source follower readout circuits - researchr publication authors

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Takahiro Kohara, Woonghee Lee, Koichi Mizobuchi, Shigetoshi Sugawa. A CMOS image sensor with 2.0-e:::-::: random noise and 110-ke:::-::: full well capacity using column source follower readout circuits. In Proceedings of the 15th Asia South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, January 18-21, 2010. pages 345-346, IEEE, 2010. [doi]

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