Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto. An Experimental Study on Latch Up Failure of CMOS LSI. In Second International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008, July 14-17, 2008, Yokohama, Japan. pages 215-216, IEEE Computer Society, 2008. [doi]
@inproceedings{KohinataAF08,
title = {An Experimental Study on Latch Up Failure of CMOS LSI},
author = {Hideo Kohinata and Masayuki Arai and Satoshi Fukumoto},
year = {2008},
doi = {10.1109/SSIRI.2008.28},
url = {http://doi.ieeecomputersociety.org/10.1109/SSIRI.2008.28},
researchr = {https://researchr.org/publication/KohinataAF08},
cites = {0},
citedby = {0},
pages = {215-216},
booktitle = {Second International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008, July 14-17, 2008, Yokohama, Japan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3266-0},
}