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Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations

Benedikt Kohlhepp, Daniel Kübrich, Marvin Tannhäuser, Andreas Hoffmann, Thomas Dürbaum. Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations. IEEE T. Instrumentation and Measurement, 69(10):7740-7751, 2020. [doi]

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Benedikt Kohlhepp

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Daniel Kübrich

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Marvin Tannhäuser

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Andreas Hoffmann

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Thomas Dürbaum

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