76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications

Masato Kohtani, Tomotoshi Murakami, Yoshiyuki Utagawa, Tomoyuki Arai, Shinji Yamaura. 76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications. J. Solid-State Circuits, 56(5):1345-1359, 2021. [doi]

@article{KohtaniMUAY21,
  title = {76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications},
  author = {Masato Kohtani and Tomotoshi Murakami and Yoshiyuki Utagawa and Tomoyuki Arai and Shinji Yamaura},
  year = {2021},
  doi = {10.1109/JSSC.2021.3066214},
  url = {https://doi.org/10.1109/JSSC.2021.3066214},
  researchr = {https://researchr.org/publication/KohtaniMUAY21},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {56},
  number = {5},
  pages = {1345-1359},
}