Detection of Defects in Soybean Seeds by Extracting Deep Features with SqueezeNet

Murat Koklu, Ramazan Kursun, Elham Tahsin Yasin, Yavuz Selim Taspinar. Detection of Defects in Soybean Seeds by Extracting Deep Features with SqueezeNet. In 12th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, IDAACS 2023, Dortmund, Germany, September 7-9, 2023. pages 713-717, IEEE, 2023. [doi]

Abstract

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