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Efficient Increasing of the Mutation Score During Model-Based Test Suite Generation

Alexander Kolchin, Stepan Potiyenko, Thomas Weigert. Efficient Increasing of the Mutation Score During Model-Based Test Suite Generation. In Ivan Sergienko, Philip Andon, editors, Proceedings of the 12th International Scientific and Practical Conference of Programming (UkrPROG 2020), Kyiv, Ukraine, September 15-16, 2020. Volume 2866 of CEUR Workshop Proceedings, pages 331-341, CEUR-WS.org, 2020. [doi]

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