Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning

Gauri Koli, Liam Nguyen, Jennifer Kitchen. Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-8, IEEE, 2023. [doi]

Authors

Gauri Koli

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Liam Nguyen

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Jennifer Kitchen

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