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Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement

Kevin Kolpatzeck, Xuan Liu, Lars Häring, Jan C. Balzer, Andreas Czylwik. Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement. Sensors, 21(16):5389, 2021. [doi]

Authors

Kevin Kolpatzeck

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Xuan Liu

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Lars Häring

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Jan C. Balzer

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Andreas Czylwik

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