Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement

Kevin Kolpatzeck, Xuan Liu, Lars Häring, Jan C. Balzer, Andreas Czylwik. Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement. Sensors, 21(16):5389, 2021. [doi]

Abstract

Abstract is missing.