OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of Analog/Mixed-Signal Circuits

Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee. OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of Analog/Mixed-Signal Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 44(10):3668-3682, October 2025. [doi]

@article{KomarrajuTAC25,
  title = {OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of Analog/Mixed-Signal Circuits},
  author = {Suhasini Komarraju and Akhil Tammana and Chandramouli N. Amarnath and Abhijit Chatterjee},
  year = {2025},
  month = {October},
  doi = {10.1109/TCAD.2025.3549353},
  url = {https://doi.org/10.1109/TCAD.2025.3549353},
  researchr = {https://researchr.org/publication/KomarrajuTAC25},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {44},
  number = {10},
  pages = {3668-3682},
}