A Practical Analog BIST Cooperated with an LSI Tester

Takanori Komuro, Naoto Hayasaka, Haruo Kobayashi, Hiroshi Sakayori. A Practical Analog BIST Cooperated with an LSI Tester. IEICE Transactions, 89-A(2):465-468, 2006. [doi]

Authors

Takanori Komuro

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Naoto Hayasaka

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Haruo Kobayashi

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Hiroshi Sakayori

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