Nobuhiko Kondo, Midori Okubo, Toshiharu Hatanaka. Early Detection of At-Risk Students Using Machine Learning Based on LMS Log Data. In 6th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2017, Hamamatsu, Japan, July 9-13, 2017. pages 198-201, IEEE, 2017. [doi]
Abstract is missing.