A Test Generation Methodology for High-Performance Computer Chips and Modules - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Bernd Könemann, Phil Noto. A Test Generation Methodology for High-Performance Computer Chips and Modules. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 826-833, IEEE Computer Society, 1992.

This author has not been identified. Look up 'Bernd Könemann' in GoogleThis author has not been identified. Look up 'Phil Noto' in Google

runs on WebDSL