Multi-label ReliefF and F-statistic feature selections for image annotation

Deguang Kong, Chris H. Q. Ding, Heng Huang, Haifeng Zhao. Multi-label ReliefF and F-statistic feature selections for image annotation. In 2012 IEEE Conference on Computer Vision and Pattern Recognition, Providence, RI, USA, June 16-21, 2012. pages 2352-2359, IEEE, 2012. [doi]

Abstract

Abstract is missing.