Jeong-Taek Kong, David Overhauser. Methods to improve digital MOS macromodel accuracy. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(7):868-881, 1995. [doi]
@article{KongO95,
title = {Methods to improve digital MOS macromodel accuracy},
author = {Jeong-Taek Kong and David Overhauser},
year = {1995},
doi = {10.1109/43.391734},
url = {http://doi.ieeecomputersociety.org/10.1109/43.391734},
researchr = {https://researchr.org/publication/KongO95},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {7},
pages = {868-881},
}