Yinan Kong, Braden Phillips. Fast Scaling in the Residue Number System. IEEE Trans. VLSI Syst., 17(3):443-447, 2009. [doi]
@article{KongP09,
title = {Fast Scaling in the Residue Number System},
author = {Yinan Kong and Braden Phillips},
year = {2009},
doi = {10.1109/TVLSI.2008.2004550},
url = {http://dx.doi.org/10.1109/TVLSI.2008.2004550},
researchr = {https://researchr.org/publication/KongP09},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {17},
number = {3},
pages = {443-447},
}