Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision

Lingfeng Kong, Jie Shen, Zongliang Hu, Ke Pan. Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision. In Wei Li, Qingli Li, Lipo Wang, editors, 11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018. pages 1-5, IEEE, 2018. [doi]

Authors

Lingfeng Kong

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Jie Shen

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Zongliang Hu

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Ke Pan

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