Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision

Lingfeng Kong, Jie Shen, Zongliang Hu, Ke Pan. Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision. In Wei Li, Qingli Li, Lipo Wang, editors, 11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018. pages 1-5, IEEE, 2018. [doi]

@inproceedings{KongSHP18,
  title = {Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision},
  author = {Lingfeng Kong and Jie Shen and Zongliang Hu and Ke Pan},
  year = {2018},
  doi = {10.1109/CISP-BMEI.2018.8633154},
  url = {https://doi.org/10.1109/CISP-BMEI.2018.8633154},
  researchr = {https://researchr.org/publication/KongSHP18},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {11th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2018, Beijing, China, October 13-15, 2018},
  editor = {Wei Li and Qingli Li and Lipo Wang},
  publisher = {IEEE},
  isbn = {978-1-5386-7604-2},
}