Deep Learning-based Test Data Augmentation Technology

Xiangwei Kong, Haidong Wu, Huiyang Hu. Deep Learning-based Test Data Augmentation Technology. In Xiaoming Zhao, Qingli Li, Lipo Wang, editors, 16th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2023, Taizhou, China, October 28-30, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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