SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features and Dual Loss Functions

Wei-Bin Kong, Zhi-Fei Zhang, Ting-Lin Zhang, Lei Wang, Zi-Yao Cheng, Mo Zhou. SMC-YOLO: Surface Defect Detection of PCB Based on Multi-Scale Features and Dual Loss Functions. IEEE Access, 12:137667-137682, 2024. [doi]

Abstract

Abstract is missing.