Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye. Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 646-651, IEEE, 2010. [doi]
Abstract is missing.