Aryeh Kontorovich, Danny Hendler, Eitan Menahem. Metric Anomaly Detection via Asymmetric Risk Minimization. In Marcello Pelillo, Edwin R. Hancock, editors, Similarity-Based Pattern Recognition - First International Workshop, SIMBAD 2011, Venice, Italy, September 28-30, 2011. Proceedings. Volume 7005 of Lecture Notes in Computer Science, pages 17-30, Springer, 2011. [doi]
Abstract is missing.