Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits

Haluk Konuk, F. Joel Ferguson. Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 597-606, IEEE Computer Society, 1997.

Authors

Haluk Konuk

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F. Joel Ferguson

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