Andrzej Korcala, Zbigniew Lukasiak, Anna Zawadzka, Przemyslaw Plóciennik, Waclaw Bala, Miroslaw Boniewiez. Admittance spectroscopy for planar and across measure configuration of metal/porous silicon/Si structures. In 16th International Conference on Transparent Optical Networks, ICTON 2014, Graz, Austria, July 6-10, 2014. pages 1-3, IEEE, 2014. [doi]
Abstract is missing.