Israel Koren, Zahava Koren, Glenn H. Chapman. Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 3-10, IEEE Computer Society, 2001. [doi]
@inproceedings{KorenKC01,
title = {Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip},
author = {Israel Koren and Zahava Koren and Glenn H. Chapman},
year = {2001},
url = {http://computer.org/proceedings/dft/1203/12030003abs.htm},
researchr = {https://researchr.org/publication/KorenKC01},
cites = {0},
citedby = {0},
pages = {3-10},
booktitle = {16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1203-8},
}